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VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
PUC
2008
13 years 4 months ago
2008
Abstract Wireless sensor networks (WSN) are designed for data gathering and processing, with particular requirements: low hardware complexity, low energy consumption, special traff...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...