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DATE
2002
IEEE
103views Hardware» more  DATE 2002»
13 years 8 months ago
Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
Anshuman Chandra, Krishnendu Chakrabarty