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    DATE
    2007
    IEEE
    86views Hardware» more  DATE 2007»
    Reduction of detected acceptable faults for yield improvement via error-tolerance
    13 years 11 months ago
    Reduction of detected acceptable faults for yield improvement via error-tolerance
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    Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
    Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
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