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ICCAD
2005
IEEE
107views Hardware» more  ICCAD 2005»
14 years 1 months ago
Projection-based performance modeling for inter/intra-die variations
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
Xin Li, Jiayong Le, Lawrence T. Pileggi, Andrzej J...