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    DDECS
    2007
    IEEE
    93views Hardware» more  DDECS 2007»
    Manifestation of Precharge Faults in High Speed DRAM Devices
    13 years 11 months ago
    Manifestation of Precharge Faults in High Speed DRAM Devices
    Download  ce.et.tudelft.nl
    Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
    Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
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