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ISCAS
2007
IEEE
96views Hardware» more  ISCAS 2007»
13 years 11 months ago
Threshold Voltage Variation Effects on Aging-Related Hard Failure Rates
Abstract— This paper quantifies the impact of threshold voltage variation on aging-related hard failure rates in a highperformance 65nm processor. Simulations show that threshol...
Brian Greskamp, Smruti R. Sarangi, Josep Torrellas