Sciweavers

VLSID
2002
IEEE
97views VLSI» more  VLSID 2002»
14 years 4 months ago
Multiple Faults: Modeling, Simulation and Test
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...