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ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
13 years 9 months ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
ISCAS
2005
IEEE
115views Hardware» more  ISCAS 2005»
13 years 10 months ago
Power-aware slack distribution for hierarchical VLSI design
Abstract— Hierarchical design plays an important role in microprocessor and ASIC domains where design complexity limits design productivity and tool capacity. Slack distribution,...
Hyung-Ock Kim, Youngsoo Shin