ASPDAC
2007
ACM
13 years 6 months ago
2007
ACM
Rising interconnect delay and power consumption have motivated the investigation of alternative integrated circuit routing architectures. In particular, the X Architecture, which ...
ASPDAC
2007
ACM
13 years 6 months ago
2007
ACM
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
Abstract-- This paper proposes a novel power-aware multifrequency wrapper architecture design to achieve at-speed testability. The trade-offs between power dissipation, scan time a...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
In the paper, we develop a systematic methodology for modeling sampled interconnect frequency response data based on spline interpolation. Through piecewise polynomial interpolatio...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
Deep submicron effects drive the complication in designing chips, as well as in package designs and communications between package and board. As a result, the iterative interface d...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
- This paper presents a real time programmable irregular Low Density Parity Check (LDPC) Encoder as specified in the IEEE P802.16E/D7 standard. The encoder is programmable for fram...