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IOLTS
2002
IEEE
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13 years 9 months ago
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
Davide Appello, Alessandra Fudoli, Vincenzo Tancor...