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CCECE
2011
IEEE
10 years 1 months ago
A simulator for local anodic oxidation of silicon surfaces
Models for the local anodic oxidation of silicon using scanning tunneling microscopy and non-contact atomic force microscopy are implemented in a generic process simulator, using ...
Lado Filipovic, Hajdin Ceric, Johann Cervenka, Sie...
ICASSP
2011
IEEE
10 years 5 months ago
Detection of elliptical particles in atomic force microscopy images
In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; ...
Jirí Sedlár, Barbara Zitová, ...
ICIP
2008
IEEE
12 years 3 months ago
Automated line flattening of Atomic Force Microscopy images
In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bo...
Sotirios A. Tsaftaris, Jana Zujovic, Aggelos K. Ka...
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