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TCAD
2011
8 years 2 months ago
Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhig...
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