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    2011
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    Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains
    12 years 12 months ago
    Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains
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    —This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
    Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Zhig...
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