ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
This paper considers two types of n-bit adders, ripple carry adders and cascaded carry look-ahead adders, with minimum tests for stuck-at fault models. In the first part, we prese...
ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
This paper considers the testability implications of low power design methodologies. Low power and high testability are shown to be highly contrasting requirements, and an optimiz...
ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
