ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...