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ATS
2010
IEEE
239views Hardware» more  ATS 2010»
9 years 11 months ago
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level
In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at...
Michael A. Kochte, Christian G. Zoellin, Rafal Bar...
ATS
2010
IEEE
250views Hardware» more  ATS 2010»
10 years 26 days ago
Efficient Embedding of Deterministic Test Data
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson,...
ATS
2010
IEEE
239views Hardware» more  ATS 2010»
10 years 2 months ago
Mining Complex Boolean Expressions for Sequential Equivalence Checking
Neha Goel, Michael S. Hsiao, Naren Ramakrishnan, M...
ATS
2010
IEEE
253views Hardware» more  ATS 2010»
10 years 2 months ago
On Signal Tracing for Debugging Speedpath-Related Electrical Errors in Post-Silicon Validation
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
Xiao Liu, Qiang Xu
ATS
2010
IEEE
261views Hardware» more  ATS 2010»
10 years 2 months ago
The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Xiaoqin Sheng, Hans G. Kerkhoff
ATS
2010
IEEE
229views Hardware» more  ATS 2010»
10 years 2 months ago
Variation-Aware Fault Modeling
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
Fabian Hopsch, Bernd Becker, Sybille Hellebrand, I...
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