DATE
2009
IEEE
13 years 8 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
ISQED
2003
IEEE
13 years 9 months ago
2003
IEEE
We present a silicon-on-insulator (SOI) pass-transistor logic (PTL) gate with an active body bias control circuit and compare the proposed PTL gate with other types of PTL gates w...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
— Process variations and temperature variations can cause both the frequency and the leakage of the chip to vary significantly from their expected values, thereby decreasing the...
ISLPED
2009
ACM
13 years 11 months ago
2009
ACM
Post-fabrication tuning for mitigating manufacturing variability is receiving a significant attention. To reduce leakage increase involved in performance compensation by body bia...