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MJ
2006
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13 years 5 months ago
Reliability analysis of the fine pitch connection using anisotropic conductive film (ACF)
A novel method (the V-shaped curve) is presented to predict the failure probability of anisotropic conductive film (ACF) in IC/substrate assemblies. The Poisson function is used t...
Chao-Ming Lin, Win-Jin Chang, Te-Hua Fang