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ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
13 years 8 months ago
Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Ch...