ITC
1998
IEEE
13 years 8 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
DATE
2003
IEEE
13 years 9 months ago
2003
IEEE
Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature A...
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...