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    ICCAD
    1995
    IEEE
    120views Hardware» more  ICCAD 1995»
    Pattern generation for a deterministic BIST scheme
    13 years 8 months ago
    Pattern generation for a deterministic BIST scheme
    Download  www.ra.informatik.uni-stuttgart.de
    Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
    Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...
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