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DATE
2007
IEEE
123views Hardware» more  DATE 2007»
13 years 11 months ago
Clock domain crossing fault model and coverage metric for validation of SoC design
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
Yi Feng 0002, Zheng Zhou, Dong Tong, Xu Cheng