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ISLPED
1996
ACM
103views Hardware» more  ISLPED 1996»
13 years 8 months ago
A 0.5V/100 MHz over-VCC grounded data storage (OVGS) SRAM cell architecture with boosted bit-line and offset source over-driving
This paper proposes a 0.5V / 100MHz / sub-5mW-operated 1-Mbit SRAM cell architecture which uses an overVCC grounded data storage (OVGS) scheme. The key target of OVGS is to minimi...
Hiroyuki Yamauchi, Toru Iwata, Hironori Akamatsu, ...
ITC
2003
IEEE
136views Hardware» more  ITC 2003»
13 years 9 months ago
A BIST Solution for The Test of I/O Speed
A delay-locked loop (DLL) based built-in self test (BIST) circuit has been designed with a 0.18 µ m TSMC process (CM018) to test chip I/O speeds, specifically, the setup and hold...
Cheng Jia, Linda S. Milor