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    DFT
    1998
    IEEE
    88views VLSI» more  DFT 1998»
    Characterization of CMOS Defects using Transient Signal Analysis
    13 years 9 months ago
    Characterization of CMOS Defects using Transient Signal Analysis
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    We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
    James F. Plusquellic, Donald M. Chiarulli, Steven ...
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