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DATE
2000
IEEE
75views Hardware» more  DATE 2000»
13 years 9 months ago
Layout Compaction for Yield Optimization via Critical Area Minimization
This paper presents a new compaction algorithm to improve the yield of IC layout. The yield is improved by reducing the area where the faults are more likely to happen known as cr...
Youcef Bourai, C.-J. Richard Shi
ISQED
2005
IEEE
112views Hardware» more  ISQED 2005»
13 years 10 months ago
Two-Dimensional Layout Migration by Soft Constraint Satisfaction
Layout migration has re-emerged as an important task due to the increasing use of library hard intellectual properties. While recent advances of migration tools have accommodated ...
Qianying Tang, Jianwen Zhu
DATE
2007
IEEE
81views Hardware» more  DATE 2007»
13 years 11 months ago
Improving utilization of reconfigurable resources using two dimensional compaction
Partial reconfiguration allows parts of the reconfigurable chip area to be configured without affecting the rest of the chip. This allows placement of tasks at run time on the rec...
Ahmed A. El Farag, Hatem M. El-Boghdadi, Samir I. ...