Sciweavers

ISBI
2004
IEEE
14 years 4 months ago
Extended Depth-of-Focus for Multi-Channel Microscopy Images: A Complex Wavelet Approach
Microscopy imaging often suffers from limited depth-offocus. However, the specimen can be `optically sectioned' by moving the object along the optical axis; different areas a...
Brigitte Forster, Dimitri Van De Ville, Jesse Bere...