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    DAC
    1996
    ACM
    79views Computer Architecture» more  DAC 1996»
    Electromigration Reliability Enhancement via Bus Activity Distribution
    13 years 9 months ago
    Electromigration Reliability Enhancement via Bus Activity Distribution
    Download  www.cs.ucr.edu
    : Electromigration induced degradation in integrated circuits has been accelerated by continuous scaling of device dimensions. We present a methodology for synthesizing high-reliab...
    Aurobindo Dasgupta, Ramesh Karri
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