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    Periodic Pattern Inspection Using Convolution Masks
    13 years 6 months ago
    Periodic Pattern Inspection Using Convolution Masks
    Download  b2.cvl.iis.u-tokyo.ac.jp
    A two-dimensional (2-D) convolution mask is proposed for detecting the location of irregularities and defects in a periodic two-dimensional signal or image. In this approach, defe...
    Y. S. Weng, Ming-Hwei Perng
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