Sciweavers

ICCD
2008
IEEE
111views Hardware» more  ICCD 2008»
14 years 1 months ago
Test-access mechanism optimization for core-based three-dimensional SOCs
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yua...