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ICIP
2008
IEEE
14 years 6 months ago
Automated line flattening of Atomic Force Microscopy images
In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bo...
Sotirios A. Tsaftaris, Jana Zujovic, Aggelos K. Ka...