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HICSS
2010
IEEE
196views Biometrics» more  HICSS 2010»
13 years 11 months ago
Combining Phasor Measurements to Monitor Cutset Angles
Power systems under stress can show large voltage angle differences between areas that can be monitored by wide area phasor measurements. One way to make this idea more specific ...
Ian Dobson, Manu Parashar, Chelsea Carter