DAC
2010
ACM
13 years 4 months ago
2010
ACM
Decoupling capacitor (decap) placement has been widely adopted as an effective way to suppress dynamic power supply noise. Traditional decap budgeting algorithms usually explore t...
DAC
2010
ACM
13 years 4 months ago
2010
ACM
Many DTM schemes rely heavily on the accurate knowledge of the chip's dynamic thermal state to make optimal performance/ temperature trade-off decisions. This information is ...
DAC
2010
ACM
13 years 5 months ago
2010
ACM
This work proposes a new problem of identifying large and tangled logic structures in a synthesized netlist. Large groups of cells that are highly interconnected to each other can...
DAC
2010
ACM
13 years 5 months ago
2010
ACM
Vectorless power grid verification makes it possible to evaluate worst-case voltage drops without enumerating possible current waveforms. Under linear current constraints, the vec...
DAC
2010
ACM
13 years 6 months ago
2010
ACM
In this study, we propose the use of specialized influence models to capture the dynamic behavior of a Network-onChip (NoC). Our goal is to construct a versatile modeling framewor...
DAC
2010
ACM
13 years 7 months ago
2010
ACM
NBTI has been a major aging mechanism for advanced CMOS technology and PBTI is also looming as a big concern. This work first proposes a compact on-chip sensor design that tracks ...
DAC
2010
ACM
2010
ACM
A probabilistic and energy-efficient scheduling approach for online application in real-time systems
13 years 7 months ago
This work considers the problem of minimizing the power consumption for real-time scheduling on processors with discrete operating modes. We provide a model for determining the ex...
DAC
2010
ACM
13 years 7 months ago
2010
ACM
Online social networks are a growing internet phenomenon: they connect millions of individuals through sharing of common interests, political and religious views, careers, etc. So...
DAC
2010
ACM
13 years 7 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
9
Voted
DAC
2010
ACM
13 years 7 months ago
2010
ACM
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and ...