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    ETS
    2006
    IEEE
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    Retention-Aware Test Scheduling for BISTed Embedded SRAMs
    13 years 10 months ago
    Retention-Aware Test Scheduling for BISTed Embedded SRAMs
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    In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
    Qiang Xu, Baosheng Wang, F. Y. Young
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