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ETS
2006
IEEE
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10 years 4 months ago
Retention-Aware Test Scheduling for BISTed Embedded SRAMs
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
Qiang Xu, Baosheng Wang, F. Y. Young
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