DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Microprocessors are today getting more and more inefficient for a growing range of applications. Its principles -The Von Neumann paradigm[3]- based on the sequential execution of ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
: A new technique is presented in this paper to improve the efficiency of data scheduling for multi-context reconfigurable architectures targeting multimedia and DSP applications. ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper, we investigate the benefits of a flexible, application-specific instruction set by adding a run-time Reconfigurable Functional Unit (RFU) to a VLIW processor. Preli...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Complex embedded systems consist of hardware and software components from different domains, such as control and signal processing, many of them supplied by different IP vendors. ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
The structure of Internet applications and scenarios is changing rapidly today. This offers new potential for established technologies and methods to expand their area of applicat...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper we introduce an approach for parameter controlled symbolic analysis of nonlinear analog circuits. Based on a state-of–the-art algorithm, it enables the removal of ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper describes the AccuPower toolset -- a set of simulation tools accurately estimating the power dissipation within a superscalar microprocessor. AccuPower uses a true hard...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...