DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—A large part of a modern SOC’s debug complexity resides in the interaction between the main system components. ion-level debug moves the abstraction level of the debug process...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—In this paper, a novel approach for integrating static non-preemptive software scheduling in formal bottom-up performance evaluation of embedded system models is described. The ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—We present an embedded software application for the real-time estimation of building occupancy using a network of video cameras. We analyze a series of alternative decomposition...
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
13 years 11 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
A new approach in hierarchical optimisation is presented which is capable of optimising both the performance and yield of an analogue design. Performance and yield trade offs are ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
This contribution shows and discusses the requirements and constraints that an industrial engineering process defines for the integration of hardware IP into the system developmen...