DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract—Building highly optimized embedded systems demands hardware/software (HW/SW) co-design. A key challenge in co-design is the design of HW/SW interfaces, which is often a ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract—In this paper a programmable Forward Error Correction (FEC) IP for a DVB-S2 receiver is presented. It is composed of a Low-Density Parity Check (LDPC), a Bose-ChaudhuriH...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
— Heat removal and power delivery are two major reliability concerns in the 3D stacked IC technology. Liquid cooling based on micro-fluidic channels is proposed as a viable solu...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
The automated design of SoCs from pre-selected IPs that may require different clocks is challenging because of the following issues. Firstly, protocol mismatches between IPs need ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—Intensive research is performed to find post-CMOS technologies. A very promising direction based on reversible logic are quantum computers. While in the domain of reversible lo...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—Negative Bias Temperature Instability (NBTI) is a significant reliability concern for nanoscale CMOS circuits. Its effects on circuit timing can be especially pronounced for ci...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract— This paper presents a six-transistor (6T) singleended static random access memory (SE-SRAM) bitcell with an isolated read-port, suitable for low-Î and low-power embedd...