DFT
1999
IEEE
13 years 8 months ago
1999
IEEE
Integrated Circuit manufacturing complexities have resulted in decreasing product yields and reliabilities. This process has been accelerated with the advent of very deep sub-micr...
ISLPED
2005
ACM
13 years 10 months ago
2005
ACM
Heat is a main concern for processors in deep sub-micron technologies. The chip temperature is affected by both the power consumption of processor components and the chip layout....
IOLTS
2006
IEEE
13 years 10 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...