ISCAS
1999
IEEE
13 years 8 months ago
1999
IEEE
-- Noise in deep submicron technology combined with the move towards dynamic circuit techniques for higher performance have raised concerns about reliability and energyefficiency o...
DSD
2002
IEEE
13 years 9 months ago
2002
IEEE
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...
GLVLSI
2003
IEEE
13 years 9 months ago
2003
IEEE
With scaling down to deep submicron and nanometer technologies, noise immunity is becoming a metric of the same importance as power, speed, and area. Smaller feature sizes, low vo...