ITC
1994
IEEE
13 years 8 months ago
1994
IEEE
: The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...
VTS
1998
IEEE
13 years 8 months ago
1998
IEEE
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...