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    DATE
    2006
    IEEE
    66views Hardware» more  DATE 2006»
    On test conditions for the detection of open defects
    13 years 11 months ago
    On test conditions for the detection of open defects
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    The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation resul...
    Bram Kruseman, Manuel Heiligers
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