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ITC
2003
IEEE
120views Hardware» more  ITC 2003»
9 years 7 months ago
High Quality ATPG for Delay Defects
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
Puneet Gupta, Michael S. Hsiao
DATE
2003
IEEE
120views Hardware» more  DATE 2003»
9 years 7 months ago
Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-...
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