ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
DATE
2003
IEEE
13 years 9 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...