DAC
1994
ACM
13 years 8 months ago
1994
ACM
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
IOLTS
2000
IEEE
13 years 8 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...