ET
2010
13 years 3 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ICCAD
1994
IEEE
13 years 8 months ago
1994
IEEE
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...
GLVLSI
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...