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ITC
1993
IEEE
148views Hardware» more  ITC 1993»
8 years 11 months ago
DELTEST: Deterministic Test Generation for Gate-Delay Faults
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
Udo Mahlstedt
VLSID
1996
IEEE
110views VLSI» more  VLSID 1996»
8 years 11 months ago
On test coverage of path delay faults
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
ISQED
2003
IEEE
147views Hardware» more  ISQED 2003»
9 years 17 days ago
On Structural vs. Functional Testing for Delay Faults
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li...
ASPDAC
2006
ACM
155views Hardware» more  ASPDAC 2006»
9 years 1 months ago
Delay defect screening for a 2.16GHz SPARC64 microprocessor
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hito...
DATE
2006
IEEE
78views Hardware» more  DATE 2006»
9 years 1 months ago
Functional constraints vs. test compression in scan-based delay testing
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
Ilia Polian, Hideo Fujiwara
VTS
2007
IEEE
129views Hardware» more  VTS 2007»
9 years 1 months ago
Supply Voltage Noise Aware ATPG for Transition Delay Faults
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2004
ACM
9 years 8 months ago
On path-based learning and its applications in delay test and diagnosis
Li-C. Wang, T. M. Mak, Kwang-Ting Cheng, Magdy S. ...
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