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DAC
2005
ACM
13 years 6 months ago
Mapping statistical process variations toward circuit performance variability: an analytical modeling approach
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
Yu Cao, Lawrence T. Clark
FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
13 years 10 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung