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    ITC
    1998
    IEEE
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    Native mode functional test generation for processors with applications to self test and design validation
    13 years 8 months ago
    Native mode functional test generation for processors with applications to self test and design validation
    Download  www.ra.informatik.uni-stuttgart.de
    New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
    Jian Shen, Jacob A. Abraham
    claim paper
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