MR
2006
13 years 4 months ago
2006
Power semiconductor devices under short-circuit are submitted to high current and high voltage simultaneously that induce high electrical and thermal stresses. Several types of ev...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will so...