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ISQED
2005
IEEE
95views Hardware» more  ISQED 2005»
13 years 10 months ago
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature
The purpose of this work is to explore how device operation parameters such as switching speed and power dissipation scale with voltage and temperature. We simulated a CMOS ring o...
Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein