DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
Safety-critical embedded systems often operate in harsh environmental conditions that necessitate fault-tolerant computing techniques. Many safety-critical systems also execute re...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper presents an approach for integrating fault-tolerance techniques into microprocessors by utilizing instruction redundancy as well as time redundancy. Smaller and smaller...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to sc...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
We discuss the use of convolutional codes to perform concurrent error detection (CED) in finite state machines (FSMs). We examine a previously proposed methodology, we identify i...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
1 Today many safety-critical applications are based on distributed systems where several computing nodes exchange information via suitable network interconnections. An example of t...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...