DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper, a simple codec algorithm based on Reed-Solomon (RS) codes is proposed for erasure correcting in RAID (Redundant Array of Independent Disks) level 6 systems. Unlike ...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
This paper presents theoretical yet practical methodologies to model, assure and optimize the Reliability of Clockless Wave Pipeline. Clockless wave pipeline is a cutting-edge and...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE