DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is available on in-field defe...
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
Dual core architectures are commonly used to establish fault tolerance on the node level. Since comparison is usually performed for the outputs only, no precise diagnostic informa...